Title :
Reduce Register Files Leakage Through Discharging Cells
Author :
Jin, Lingling ; Wu, Wei ; Yang, Jun ; Zhang, Chuanjun ; Zhang, Youtao
Author_Institution :
Univ. of California, Riverside
Abstract :
We propose a low-leakage register file cell design based on the observation that the physical registers in a superscalar processor have very short life cycles. When a register is dead, we discharge its cells to ´0´ to greatly reduce the leakage current from the read bitlines to the ground. Our design has no impact to critical register read access path. Projected to future 45 nm technology, our design yields additional 38% and 47% leakage power savings on top of the existing low-leakage cell designs for 64-bit and 32-bit datapath, respectively. Taking into the account of dynamic energy savings due to the elimination of write ´0´ operations, our design saves nearly 20% of total energy.
Keywords :
electrical faults; fault diagnosis; secondary cells; discharging cells; life cycles; reduce register files leakage; superscalar processor; CMOS technology; Circuit simulation; Cities and towns; Computer science; Energy management; Leakage current; Microprocessors; Registers; Temperature; Thermal management;
Conference_Titel :
Computer Design, 2006. ICCD 2006. International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7803-9707-1
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2006.4380803