DocumentCode :
2066473
Title :
Effect of package construction on thermal performance of plastic IC packages
Author :
Bhandarkar, Navin ; Mhaisalkar, Subodh ; Lee, Pauline ; Tracy, Daniel
Author_Institution :
Nat. Semicond. Manuf. Singapore Pte Ltd., Singapore
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
65
Lastpage :
68
Abstract :
This paper explores the effect of package geometry and material on the junction-to-ambient thermal resistance (Θja) of plastic IC packages. Only internal package geometry changes are explored here for packages operating under still-air ambient conditions. Among the factors explored in this paper are drop-in heat spreaders, high thermal conductivity mold compounds and die-attach epoxies, and the effect of die-attach delamination. Forced convection and external heatsinks are not studied here, as they can form an extensive topic of study on their own
Keywords :
adhesion; encapsulation; finite element analysis; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; microassembling; plastic packaging; thermal conductivity; thermal resistance; FEA; die-attach delamination; die-attach epoxies; drop-in heat spreaders; external heatsinks; forced convection; internal package geometry; junction-to-ambient thermal resistance; package construction; package geometry; package material; plastic IC packages; still-air ambient conditions; thermal conductivity mold compounds; thermal performance; Automatic testing; Delamination; Electronic packaging thermal management; Geometry; Plastic integrated circuit packaging; Semiconductor device packaging; Temperature; Thermal conductivity; Thermal factors; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
Type :
conf
DOI :
10.1109/EPTC.1997.723887
Filename :
723887
Link To Document :
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