Title :
27.9 A 200kS/s 13.5b integrated-fluxgate differential-magnetic-to-digital converter with an oversampling compensation loop for contactless current sensing
Author :
Kashmiri, Mahdi ; Kindt, Wilko ; Witte, Frerik ; Kearey, Robin ; Carbonell, Daniel
Author_Institution :
Texas Instrum., Santa Clara, CA, USA
Abstract :
High voltage applications such as electric motor controllers, solar panel power inverters, electric vehicle battery chargers, uninterrupted and switching mode power supplies benefit from the galvanic isolation of contactless current sensors (CCS) [1]. These include magnetic sensors that sense the magnetic field emanating from a current-carrying conductor. The offset and resolution of Hall-effect sensors is in the μT-level [1-3], in contrast to the μT-level accuracy of integrated-fluxgate (IFG) magnetometers [4]. Previously reported sampled-data closed-loop IFG readouts have limited BWs as their sampling frequencies (4) are limited to be less than or equal to the IFG excitation frequency, fEXC [5-7]. This paper describes a differential closed-loop IFG CCS with fs>fEXC. The differential architecture rejects magnetic stray fields and achieves 750x larger BW than the prior closed-loop IFG readouts [6-7] with 10×better offset than the Hall-effect sensors [1-3].
Keywords :
CMOS integrated circuits; Hall effect; conductors (electric); fluxgate magnetometers; isolation technology; power convertors; μT-level; Hall-effect sensor resolution; IFG excitation frequency; closed-loop IFG magnetometer; contactless current sensing; contactless current sensor; current-carrying conductor; differential architecture; differential closed-loop IFG CCS galvanic isolation; high voltage applications; integrated-fluxgate differential magnetic-to-digital converter; integrated-fluxgate magnetometer; magnetic field sensing; magnetic sensors; magnetic stray field rejection; nT-level; oversampling compensation loop; CMOS integrated circuits; Finite impulse response filters; Magnetic cores; Magnetic sensors; Magnetometers; Noise;
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
DOI :
10.1109/ISSCC.2015.7063140