A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation

Author

Wen, Xiaoqing ; Miyase, Kohei ; Suzuki, Tatsuya ; Yamato, Yuta ; Kajihara, Seiji ; Wang, Laung-Terng ; Saluja, Kewal K.

Author_Institution

Kyushu Inst. of Technol., Iizuka

fYear

2007

fDate

1-4 Oct. 2007

Firstpage

251

Lastpage

258

Abstract

X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling method based on two novel concepts: (1) X-score for X-filling target selection and (2) probabilistic weighted capture transition count for Y-filling value selection. Experimental results show the superiority of the new X-filling method for capture power reduction.

Keywords

automatic test pattern generation; boundary scan testing; logic circuits; logic testing; IR-drop-induced yield loss; X-filling target selection; X-score; Y-filling value selection; circuit modification; low-capture-power scan test generation; power capture reduction; probabilistic weighted capture transition count; Automatic test pattern generation; Automatic testing; Circuit testing; Combinational circuits; Costs; Flip-flops; Integrated circuit testing; Large-scale systems; Logic testing; Power dissipation; Scan test; X-filling; capture; test generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design, 2006. ICCD 2006. International Conference on

Conference_Location

San Jose, CA

ISSN

1063-6404

Print_ISBN

978-0-7803-9707-1

Electronic_ISBN

1063-6404

Type

conf

DOI

10.1109/ICCD.2006.4380825

Filename

4380825