DocumentCode
2067034
Title
Space-charge profiles with high densities in uniform and nonuniform polymer dielectrics
Author
Künstler, W. ; Gerhard-Multhaupt, R.
Author_Institution
Appl. Condensed-Matter Phys., Univ. of Potsdam, Germany
Volume
1
fYear
1997
fDate
19-22, Oct 1997
Firstpage
72
Abstract
Rather high space-charge densities were achieved in the bulk of several Teflon fluoropolymers by means of corona charging at an elevated temperature. The resulting electric-field distributions were probed with piezoelectrically generated pressure steps; this technique is particularly well suited for directly measuring spread space-charge distributions in the volume of thin polymer films. From the calibrated pressure-step results, it is possible to estimate space-charge and thus also filled-trap densities; maximum space-charge densities of 600 C/m 3 corresponding to filled-trap densities of almost 4×10 15 cm-3 were observed on Teflon PFA under the present charging and annealing conditions, while the maximum space-charge densities in the other two Teflon variants were smaller by a factor of up to three. Some typical recent results on positively and negatively corona-charged samples of the three Teflon polymers TFE, FEP, and PFA are presented together with results on two-layer samples consisting of one positively and one negatively charged film, which demonstrate that the charges in the volumes of the individual films are quite well preserved upon mechanical (and electrical) surface contact
Keywords
deep levels; electrets; electron traps; polyethylene insulation; polymer films; space charge; Teflon fluoropolymers; corona charging; electric-field distributions; filled-trap densities; nonuniform polymer dielectrics; piezoelectrically generated pressure steps; polymer films; space-charge profiles; spread space-charge distributions; surface contact; two-layer samples; uniform polymer dielectrics; Annealing; Charge measurement; Current measurement; Dielectrics; Electrets; Physics; Polymer films; Surface charging; Temperature; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-3851-0
Type
conf
DOI
10.1109/CEIDP.1997.634561
Filename
634561
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