• DocumentCode
    2067062
  • Title

    The role of surface morphology on interfacial adhesion in IC packaging

  • Author

    Lee, Charles ; Rasiah, Ignatius ; Chai, T.C. ; Gopalakrishnan, R.

  • Author_Institution
    Siemens Components Pte Ltd, Singapore
  • fYear
    1997
  • fDate
    8-10 Oct 1997
  • Firstpage
    201
  • Lastpage
    207
  • Abstract
    The role of surface morphology on moulding compound/leadframe adhesion was investigated. The surface morphology of the leadframe was modified by wet chemical treatments and abrasive blasting. In this study, the electroless Cu treatment was found to be more effective in imparting micro-level roughening than abrasive blasting. The surface roughness was found to improve interfacial adhesion and the results suggested that micro-roughness was more beneficial, rather than macro-roughness, for adhesion enhancement. The inadequacy of using RMS and Ra methods to quantify roughness was discussed. The surface area, surface area difference and power spectral density functions are proposed for more reliable and consistent roughness quantification
  • Keywords
    abrasion; adhesion; electroless deposition; encapsulation; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; interface roughness; moulding; rough surfaces; surface topography; surface treatment; Cu; IC packaging; RMS methods; abrasive blasting; adhesion enhancement; electroless Cu treatment; interfacial adhesion; leadframe surface morphology; macro-roughness; micro-level roughening; micro-roughness; moulding compound/leadframe adhesion; power spectral density function; roughness quantification; surface area difference function; surface area function; surface morphology; wet chemical treatments; Adhesives; Integrated circuit packaging; Microelectronics; Rough surfaces; Sandblasting; Surface morphology; Surface roughness; Surface topography; Surface treatment; Thermodynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
  • Print_ISBN
    0-7803-4157-0
  • Type

    conf

  • DOI
    10.1109/EPTC.1997.723910
  • Filename
    723910