• DocumentCode
    2067179
  • Title

    Effects of interfacial residual stress on Tg of epoxy resin

  • Author

    Wang, Hongbing ; Siow, Kok Siong

  • Author_Institution
    Dept. of Chem., Nat. Univ. of Singapore, Singapore
  • fYear
    1997
  • fDate
    8-10 Oct 1997
  • Firstpage
    228
  • Lastpage
    232
  • Abstract
    Distinct differences in the glass transition temperatures (Tg ) of epoxy resins were observed when their samples were prepared in two different ways. In the first method (A) of preparation, the mixture of epoxy resin and curing agent was cured and cooled directly in an aluminum pan for DSC measurement. There were strong interfacial residual stresses in these samples. In the second method (B), epoxy resin was cured and cooled on a polytetrafluoroethylene (PTFE) plate, cut into small circular pieces and then placed in aluminum pans, and no interfacial residual stresses were found in these samples. The curing and cooling conditions for samples prepared by these two methods were otherwise exactly the same. The samples by method A with strong residual stresses showed lower Tg and broader transition ranges (δT) than those by method B. With an increase in the rate of cooling for epoxy resin, the Tg for samples by method A decreased more than that for samples by method B. The transition range for A samples also increased more than that for B samples. The effects of residual stress on Tg are substantiated by experimental results of the relaxation of interfacial residual stress or the incorporation of freezing stress
  • Keywords
    differential scanning calorimetry; encapsulation; freezing; glass transition; heat treatment; integrated circuit packaging; internal stresses; materials testing; moulding; plastic packaging; polymers; thermal stresses; Al; DSC measurement; PTFE plate; aluminum pan cooling; cooling; cooling conditions; cooling rate; curing; curing conditions; encapsulation; epoxy resin; epoxy resin/curing agent mixture; freezing stress; glass transition temperatures; interfacial residual stress effects; interfacial residual stress relaxation; interfacial residual stresses; moulding compounds; plastic IC packaging; polytetrafluoroethylene plate; residual stresses; transition ranges; Aluminum; Cooling; Curing; Epoxy resins; Glass; Internal stresses; Residual stresses; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
  • Print_ISBN
    0-7803-4157-0
  • Type

    conf

  • DOI
    10.1109/EPTC.1997.723914
  • Filename
    723914