• DocumentCode
    2067190
  • Title

    Rugged compact metallized capillary Raman probe for material identification in hostile environments

  • Author

    Bortnik, Bartosz ; Kirby, James P. ; Lambert, James

  • Author_Institution
    Jet Propulsion Labs., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2010
  • fDate
    6-13 March 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper we present the use of metallic waveguides as optical Raman probes for identification of various organic and inorganic compounds. In contrast to silica waveguides, metallic capillaries possess significant space savings and robust mechanical properties allowing the employment of such probes in hostile atmosphere and space environments. Furthermore, recent fabrication advances have produced metallic waveguides with low loss in the ultraviolet region, allowing the use of ultraviolet light as an excitation source in Raman spectroscopy, thereby decreasing background noise from sample and instrument fluorescence. Accordingly, we will present encouraging experimental results on the implementation of Raman spectroscopy using these metal capillaries and discuss their potential application to future space missions. This work is being developed as a NASA Planetary Instrument Definition and Development (PIDDP) task.
  • Keywords
    Raman spectra; Raman spectroscopy; astronomical spectra; planetary atmospheres; PIDDP; Planetary Instrument Definition and Development; Raman spectroscopy; future space missions; hostile atmosphere; inorganic compound identification; instrument fluorescence; material identification; metallic capillaries; metallic waveguides; optical Raman probes; organic compound identification; robust mechanical properties; space environments; ultraviolet region; Inorganic compounds; Inorganic materials; Instruments; Metallization; Optical materials; Optical waveguides; Probes; Raman scattering; Silicon compounds; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2010 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    978-1-4244-3887-7
  • Electronic_ISBN
    1095-323X
  • Type

    conf

  • DOI
    10.1109/AERO.2010.5446979
  • Filename
    5446979