• DocumentCode
    2067213
  • Title

    A Pattern Generation Technique for Maximizing Power Supply Currents

  • Author

    Ganeshpure, Kunal ; Sanyal, Alodeep ; Kundu, Sandip

  • Author_Institution
    Massachusetts Univ., Amherst
  • fYear
    2007
  • fDate
    1-4 Oct. 2007
  • Firstpage
    338
  • Lastpage
    343
  • Abstract
    Max-current analysis is essential in power rail design and power supply switching noise analysis. Traditionally, maximum current from all CMOS gates are added together to compute maximum current level. This approach ignores all Boolean relationships. The problem of finding the input vector pair that will cause worst case current draw from the power rails when Boolean relationships are considered is an NP-hard problem. In this paper, we propose a Current Maximizing Pattern Generation (CMPG) algorithm which greatly reduces the computational complexity by using a parameterized branch-and-bound heuristic that prunes the search space by looking for a lower as well as an upper bound for maximum switching currents. When allowed to proceed indefinitely, the CMPG algorithm converges on an exact solution instead of finding upper and lower bounds. When coupled with a switch level SAT solver, CMPG can generate patterns for cell library characterization.
  • Keywords
    Boolean algebra; CMOS integrated circuits; circuit noise; computational complexity; optimisation; power supply circuits; Boolean relationships; CMOS gates; NP-hard problem; cell library characterization; computational complexity; current maximizing pattern generation algorithm; max-current analysis; pattern generation technique; power supply switching noise analysis; Character generation; Computational complexity; Current supplies; Libraries; NP-hard problem; Power generation; Power supplies; Rails; Switches; Upper bound; Max-satisfiability; Pattern Generation; Peak Current Analysis; Power Supply Current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2006. ICCD 2006. International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-0-7803-9707-1
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2006.4380838
  • Filename
    4380838