Title : 
Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations
         
        
            Author : 
Celik, Emrah ; Oterkus, Erkan ; Guven, Ibrahim ; Madenci, Erdogan
         
        
            Author_Institution : 
Aerosp. & Mech. Eng. Dept., Univ. of Arizona, Tucson, AZ
         
        
        
        
        
        
            Abstract : 
In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.
         
        
            Keywords : 
atomic force microscopy; elastic moduli; nanoindentation; polymer films; yield stress; AFM nanoindentation test; PS thin film; bulk PDMS; elastic modulus; force-indentation depth; hard thin-film polymer; peridynamic simulations; polymethyldisiloxane; polystyrene; search algorithm; soft polymer; ultrathin films; yield stress; Aerospace materials; Aerospace simulation; Aerospace testing; Atomic force microscopy; Computational modeling; Materials testing; Nanostructured materials; Optical films; Performance evaluation; Polymers;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
         
        
            Conference_Location : 
San Diego, CA
         
        
        
            Print_ISBN : 
978-1-4244-4475-5
         
        
            Electronic_ISBN : 
0569-5503
         
        
        
            DOI : 
10.1109/ECTC.2009.5074026