• DocumentCode
    2067296
  • Title

    Assertion-Based Microarchitecture Design for Improved Fault Tolerance

  • Author

    Reddv, V.K. ; Al-Zawawi, Ahmed S. ; Rotenberg, Eric

  • Author_Institution
    North Carolina State Univ., Raleigh
  • fYear
    2007
  • fDate
    1-4 Oct. 2007
  • Firstpage
    362
  • Lastpage
    369
  • Abstract
    Protection against transient faults is an important constraint in high-performance processor design. One strategy for achieving efficient reliability is to apply targeted fault checking/masking techniques to different units within an overall reliability regimen. In this spirit, we propose a novel class of targeted fault checks that verify the functioning of the microarchitecture itself, as opposed to the broader challenge of verifying overall architectural correctness of a running program. That is, the checks focus on verifying the mechanics of executing the program. Long term, discriminating between machinery and state may lead to highly efficient reliability solutions with high coverage. The key idea is to identify and exploit opportunities to assert microarchitectural "truths". We explore two examples, Register Name Authentication (RNA) for the rename unit and Timestamp-Based Assertion Checking (TAC) for the issue unit of a contemporary out-of-order superscalar processor. Thousands of fault injection experiments show that RNA and TAC microarchitectural assertions detect most unmasked faults for which they are designed.
  • Keywords
    fault tolerant computing; microprocessor chips; assertion-based microarchitecture design; fault checking; fault masking; fault tolerance; out-of-order superscalar processor; register name authentication; timestamp-based assertion checking; Authentication; Fault detection; Fault tolerance; Machinery; Microarchitecture; Out of order; Process design; Protection; RNA; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2006. ICCD 2006. International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-0-7803-9707-1
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2006.4380842
  • Filename
    4380842