Title :
Investigation on effectiveness of series gate resistor in CDM ESD protection designs
Author :
Yuanzhong Zhou ; Righter, Alan W. ; Hajjar, Jean-Jacques
Author_Institution :
Analog Devices Inc., Wilmington, MA, USA
Abstract :
The impact of gate series resistor on CDM protection effectiveness is systematically evaluated using SPICE simulation and verified with a modified VF-TLP test method. It is shown that the effectiveness of the resistor to a MOS input device is highly dependent on the size of the protected MOS device as well as on the types of ESD protection circuits. Larger MOS devices require smaller resistance values than smaller devices.
Keywords :
MIS devices; electrostatic discharge; integrated circuit testing; resistors; CDM ESD protection designs; MOS input device; SPICE simulation; VF-TLP test method; series gate resistor; Electrostatic discharges; Logic gates; MOSFET; Monitoring; Resistors; Stress;
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4673-6415-7
DOI :
10.1109/ASICON.2013.6811976
