DocumentCode
2067403
Title
Investigation on effectiveness of series gate resistor in CDM ESD protection designs
Author
Yuanzhong Zhou ; Righter, Alan W. ; Hajjar, Jean-Jacques
Author_Institution
Analog Devices Inc., Wilmington, MA, USA
fYear
2013
fDate
28-31 Oct. 2013
Firstpage
1
Lastpage
4
Abstract
The impact of gate series resistor on CDM protection effectiveness is systematically evaluated using SPICE simulation and verified with a modified VF-TLP test method. It is shown that the effectiveness of the resistor to a MOS input device is highly dependent on the size of the protected MOS device as well as on the types of ESD protection circuits. Larger MOS devices require smaller resistance values than smaller devices.
Keywords
MIS devices; electrostatic discharge; integrated circuit testing; resistors; CDM ESD protection designs; MOS input device; SPICE simulation; VF-TLP test method; series gate resistor; Electrostatic discharges; Logic gates; MOSFET; Monitoring; Resistors; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location
Shenzhen
ISSN
2162-7541
Print_ISBN
978-1-4673-6415-7
Type
conf
DOI
10.1109/ASICON.2013.6811976
Filename
6811976
Link To Document