DocumentCode :
2067530
Title :
Advanced Surface Laminar Circuit Packaging with low Coefficient of Thermal Expansion and high wiring density
Author :
Yamanaka, Kimihiro ; Kobayashi, Kaoru ; Hayashi, Katsura ; Fukui, Masahiro
Author_Institution :
Adv. Packaging Lab., KYOCERA SLC Technol. Corp., Yasu
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
325
Lastpage :
332
Abstract :
Flip-chip bonding on organic sequential build-up substrate technology has been an essential part of semiconductor packaging. In the quest for an ever higher semiconductor performance there has been a rapid increasing need for a finer pitch area array flip-chip joints. However, the pitch has been limited by the packaging technology. Advanced Surface Laminar Circuit (Adv-SLC) packaging technology has been developed to satisfy the requirements for the most advanced semiconductor devices. Adv-SLC is a build-up substrate featuring a low Coefficient of Thermal Expansion (CTE) of 3 ppm/degC, a fine pattern of 8 mum in line width and spacing, plated through-holes of 100 mum in pitch and micro-vias of 25degm in diameter. These features accommodate the density of a chip I/O of 104 cm-2, which is about ten times greater than that achieved in current organic packaging, and enables significant size reduction of semiconductor chips and the associated packages. The low CTE significantly reduces the strain in the solder joints during the reflow process and ensures the solder joint reliability. The CTE can be expanded to 5 ppm/degC by adjusting the volume ratio of the resin in the core. This paper describes recent progress in the development of Adv-SLC packaging technology.
Keywords :
flip-chip devices; integrated circuit bonding; integrated circuit packaging; organic semiconductors; reflow soldering; thermal expansion; wiring; organic sequential build-up substrate technology; pitch area array flip-chip bonding; reflow process; semiconductor packaging; solder joint reliability; surface laminar circuit packaging; thermal expansion; wiring density; Bonding; Capacitive sensors; Circuits; Resins; Semiconductor device packaging; Semiconductor devices; Soldering; Substrates; Thermal expansion; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074035
Filename :
5074035
Link To Document :
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