Title :
Electro magnetic simulation and measurement of electrical parasitics in high density QFP packages
Author :
Iyer, M.K. ; Lin, F. ; Hia, H.H. ; Prasanna, S.
Author_Institution :
Inst. of Microelectron., Singapore
Abstract :
The signal distortion caused by the RLC parasitics associated with IC packages has become a factor of concern. This paper describes the application of three dimensional field solving software to model and extract parasitics associated with the wire bonds and package leads of a PQFP package. The simulated results are compared with the frequency domain measurement results and are found to be in good agreement. The Vector Network Analyser (VNA) based S-parameter measurement technique is used to obtain package inductance and capacitance. The measurement methodology and test set-up are presented in this paper. The package electrical parameters are determined per unit interconnect length
Keywords :
S-parameters; capacitance; electric distortion; electromagnetic fields; frequency-domain analysis; inductance; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; integrated circuit testing; lead bonding; network analysers; plastic packaging; 3D field solving software; IC packages; PQFP package; RLC parasitics; Vector Network Analyser-based S-parameter measurement technique; electrical parasitics; electrical parasitics measurement; electromagnetic simulation; frequency domain measurement; high density QFP packages; interconnect length; measurement methodology; package capacitance; package electrical parameters; package inductance; package leads; parasitics model; signal distortion; test set-up; wire bonds; Application software; Distortion measurement; Electric variables measurement; Frequency domain analysis; Frequency measurement; Integrated circuit packaging; Magnetic field measurement; Scattering parameters; Software packages; Wire;
Conference_Titel :
Electronic Packaging Technology Conference, 1997. Proceedings of the 1997 1st
Print_ISBN :
0-7803-4157-0
DOI :
10.1109/EPTC.1997.723928