DocumentCode :
2068257
Title :
Sinusoidal fringe-pattern projection for 3-D surface measurement with variable illuminance
Author :
Waddington, Christopher ; Kofman, Jonathan
Author_Institution :
Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
fYear :
2010
fDate :
25-27 Oct. 2010
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents a method of projecting sinusoidal fringe patterns with modified maximum gray level to accommodate variable ambient illuminance that would otherwise cause intensity saturation and measurement error in phase-shifting surface-shape measurement. The maximum input gray level (MIGL) in the projected patterns can be reduced to an optimal trade-off point, below which the image intensity signal-to-noise ratio would diminish the advantage of further MIGL reduction. Measurement simulations using ten MIGLs (75 to 255) demonstrated reduction in RMS errors for ambient illuminance of 600, 700, 800 and 900 lx, from 0.31, 0.45, 0.75 and 1.21 mm, respectively, to 0.2 mm. The advantage of the approach was confirmed in real measurements of a flat plate and human mask.
Keywords :
measurement errors; optical images; optical projectors; shape measurement; 3D surface measurement; MIGL; RMS error; image intensity; intensity saturation; maximum input gray level; measurement error; phase-shifting surface-shape measurement; signal-to-noise ratio; sinusoidal fringe-pattern projection; variable ambient illuminance; Computational modeling; Measurement errors; Measurement uncertainty; Noise; Noise measurement; Optimized production technology; Phase measurement; fringe projection; gray level; illuminance; saturation; shape measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies (ISOT), 2010 International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-7684-8
Type :
conf
DOI :
10.1109/ISOT.2010.5687389
Filename :
5687389
Link To Document :
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