DocumentCode :
2068393
Title :
Temperature dependence of barrier height in GaAs planar doped barrier diodes
Author :
Van Tuyeri, V. ; Hu, Zhirun ; Rezazadeh, Ali
Author_Institution :
Dept. of Electron. Eng., King´´s Coll., London, UK
fYear :
2001
fDate :
2001
Firstpage :
143
Lastpage :
147
Abstract :
We have investigated the reason for the temperature dependence barrier height of Planar Doped Barriers Diode (PDBD). It has been found, that the electron spill-over effect plays an important role in the functioning of PDBDs, especially in the case of low barrier PDBDs. This effect is a sensitive function of the temperature, which changes the electric field distribution in the undoped layer and therefore the barrier height. However, in contrast to the barrier height of Schottky diodes, the barrier height of PDBD increases with increasing temperature. This fact improves the temperature stability of PDBD. In this paper the theory is outlined concisely and some results of analytical solution and computer simulation using SILVACO software are reported. The results show that the barrier height of a typically low barrier GaAs PDBD has a positive temperature coefficient up to 0.15 meV/K in the temperature range of 200-400 K
Keywords :
III-V semiconductors; electron density; gallium arsenide; semiconductor device models; semiconductor diodes; thermal stability; 200 to 400 K; GaAs; GaAs planar doped barrier diodes; SILVACO software; barrier height; computer simulation; electric field distribution; electron spill-over effect; low barrier PDB diodes; majority carrier semiconductor devices; positive temperature coefficient; temperature dependence; temperature stability; undoped layer; Cathodes; Computer simulation; Electron mobility; Gallium arsenide; Schottky diodes; Semiconductor diodes; Stability; Temperature dependence; Temperature distribution; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2001 International Symposium on
Conference_Location :
Vienna
Print_ISBN :
0-7803-7049-X
Type :
conf
DOI :
10.1109/EDMO.2001.974298
Filename :
974298
Link To Document :
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