Title :
Dynamic, nonlinear and passive immunity model of microcontroller for time domain simulation
Author :
Su, Tao ; Unger, Markus ; Steinecke, Thomas ; Weigel, Robert
Author_Institution :
Infineon Technol., Neubigerg
Abstract :
This paper presents an approach to simulate the immunity of the microcontroller based on dynamic, nonlinear and passive model. By introducing the dynamic elements, this modelling technique reflects both those dynamic and nonlinear behaviour of ports and cores of the microcontroller. It can simulate not only external interference from outside but also the internal interference of the microcontroller itself. The dynamic model is suitable for time domain simulation. It is capable of simulating both RF and pulse immunity of the microcontroller.
Keywords :
electromagnetic pulse; microcontrollers; dynamic nonlinear immunity model; internal interference; microcontroller model; nonlinear behaviour; passive immunity model; pulse immunity; time domain simulation; Circuit noise; Digital integrated circuits; Electric variables; Immunity testing; Integrated circuit modeling; Interference; Microcontrollers; Pins; Semiconductor device noise; Voltage; Dynamic; Immunity; Microcontroller; Modelling; Nonlinear; Passive;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559803