Title :
EDFA models for network simulation purposes
Author :
Schmidtke, H.-J. ; Heckel, W. ; Heppner, B.H. ; Peller, U. ; Horwath, J. ; Leitgeb, E.
Author_Institution :
Siemens AG, Munich, Germany
Abstract :
An efficient method for parameter extraction and characterization of erbium-doped fiber amplifiers (EDFA) is proposed The method can be used to simulate the gain and noise behavior of amplifiers for DWDM systems or can be used to replace a costly measurement setup of up to 80 or more wavelength selected laser sources by a tunable laser and a fixed laser for saturation purposes. The predictions of the simulations comply with the experiment within the measurement accuracies and help to understand new up-coming optical amplifier technologies and ensure more reliable optical system designs
Keywords :
optical communication equipment; optical fibre amplifiers; optical fibre networks; optical noise; wavelength division multiplexing; DWDM systems; EDFA models; erbium-doped fiber amplifiers; fixed laser; gain behavior; measurement accuracies; network simulation; noise behavior; optical amplifier technologies; optical system designs; parameter extraction; saturation; tunable laser; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Gain measurement; Laser noise; Optical fiber amplifiers; Optical saturation; Parameter extraction; Stimulated emission; Wavelength division multiplexing; Wavelength measurement;
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2001 International Symposium on
Conference_Location :
Vienna
Print_ISBN :
0-7803-7049-X
DOI :
10.1109/EDMO.2001.974322
