Title :
Surface profilometry and low coherence interferometry by electronically controlled optical sampling
Author :
Kray, S. ; Spöler, F. ; Hellere, T. ; Kurz, H.
Author_Institution :
Inst. of Semicond. Electron., RWTH Aachen Univ., Aachen, Germany
Abstract :
In optical sampling, a transient waveform under study is sampled with time delayed laser pulses, achieving a high time resolution. The limitations in measurement time due to the mechanical adjustment of the time delay can be overcome by asynchronous optical sampling (ASOPS), where two pulsed lasers with slightly detuned repetition rates are employed. This technique is commonly used for studying transient characteristics, for infrared spectrometry as well as remote sensing applications and optical coherence tomography. However, a static difference in repetition rates leads to static scanning ranges, resulting in unnecessary large measurement times and large amounts of measured data especially for the latter applications.
Keywords :
delays; light coherence; light interferometry; measurement by laser beam; optical control; asynchronous optical sampling; detuned repetition rates; electronically controlled optical sampling; infrared spectrometry; low coherence interferometry; optical coherence tomography; remote sensing applications; static scanning; surface profilometry; time delayed laser pulses; transient waveform; Integrated optics; Optical variables measurement; Power capacitors;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5943064