DocumentCode :
2068988
Title :
Charging effects under electron beam injection on sapphire implanted with zirconium ions
Author :
Berroug, A. ; Bigarré, J. ; Fayeulle, S. ; Tréheux, D.
Author_Institution :
Ecole Centrale de Lyon, Ecully, France
Volume :
1
fYear :
1997
fDate :
19-22, Oct 1997
Firstpage :
97
Abstract :
During bombardment of a dielectric material with a high energy electron beam (few 10 kV), the electrons trapped in the material induce a high negative electric field which increases the surface potential and the secondary electron emission. So, in order to understand the space charge formation in insulators, it is necessary to characterize these charging effects which can modify the injection conditions (primary energy and spot size) and the trapping ability. Focused electron injection on sapphire implanted with zirconium ions was achieved in a SEM with an energy of 30 kV. The trapping of charges was followed during the electron injection by recording the absorbed current. After injection, the quantity of trapped charges was measured by observing the mirror “image” created at low potential and compared to the quantity of “image” charges. The trapping rate decreases rapidly when the quantity of electrons trapped in the material increases. This decreasing is related to the electric field due to the electrons already trapped in the material
Keywords :
electron beam effects; electron traps; ion implantation; sapphire; secondary electron emission; space charge; surface charging; surface potential; zirconium; 30 kV; Al2O3:Zr; SEM; absorbed current; charging; dielectric material; electric field; electron trapping; focused electron beam injection; insulator; mirror image charge; sapphire; secondary electron emission; space charge; surface potential; zirconium ion implantation; Current measurement; Dielectric materials; Dielectrics and electrical insulation; Electron beams; Electron emission; Electron traps; Mirrors; Space charge; Surface charging; Zirconium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3851-0
Type :
conf
DOI :
10.1109/CEIDP.1997.634568
Filename :
634568
Link To Document :
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