DocumentCode :
2069024
Title :
The effects of electrical fast transient (EFT)/Burst on ADSL background noise
Author :
Abdullah, W. R Wan ; Mahtar, F. ; Abidin, A. N Zainal ; Jenu, M.Z.M. ; Ramli, A.
Author_Institution :
EMC&Power Quality Program, TM R&D Sdn. Bhd., Selangor
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
84
Lastpage :
87
Abstract :
This paper investigates the effects of EFT/burst on ADSL noise spectral background. The conducted immunity EFT/burst test is a very severe test in EMC test family. The test signal is a very fast transient and has significant energy level. It is worth noting that because of their repetitive nature, EFT/burst events can also result in erratic behavior of a communication system. This paper is written with the aim of verifying experimentally the effects of EFT/burst signal on the ADSL 25 kHz to 2.2 MHz. Based on our early finding; it was found that the EFT/burst can increase the background noise power spectrum density within ADSL spectrum by 19 dB in average. This phenomenon definitely will reduce the signal to noise ratio (SNR) of the ADSL system, which will significantly jeopardize the ADSL performance and causing unreliable connectivity.
Keywords :
digital subscriber lines; electromagnetic compatibility; ADSL noise spectral background; EFT-burst events; EMC test family; communication system; electrical fast transient; power spectrum density; signal to noise ratio; Background noise; Communication cables; Digital communication; Electromagnetic compatibility; Electromagnetic transients; Gaussian noise; Immunity testing; Interference; Noise level; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4559817
Filename :
4559817
Link To Document :
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