Title :
Calibration of the multistate vector network analyzer using only three fully known standards
Author :
Pauk, Lukas ; Sistek, Jan
Author_Institution :
Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
Abstract :
Vector network analyzers represent an indispensable instrument for the design and fabrication of microwave circuits. Classic cumbersome analyzers comprising heterodyne receivers can be replaced by simpler instruments called reflectometers. The paper deals with calibration of a multistate reflectometer. It reviews the current state of the art and presents a new method that requires only three fully known standards
Keywords :
calibration; measurement standards; microwave reflectometry; network analysers; VNAs; calibration; fully known standards; measurement standards; microwave circuits; multistate reflectometer; vector network analyzers; Calibration; Circuits; Detectors; Equations; Frequency; Instruments; Measurement standards; Optical reflection; Performance evaluation; Power measurement;
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2001 International Symposium on
Conference_Location :
Vienna
Print_ISBN :
0-7803-7049-X
DOI :
10.1109/EDMO.2001.974327
