• DocumentCode
    2069169
  • Title

    Interfacial stresses in a bi-material assembly subjected to external tensile forces and bending moments applied to the ends of one of its components

  • Author

    Suhir, E. ; Vujosevic, Mirko

  • Author_Institution
    Univ. of California, Santa Cruz, CA
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    692
  • Lastpage
    699
  • Abstract
    We examine an elongated bi-material adhesively bonded or soldered assembly with a continuous compliant attachment (bonding layer). The assembly is subjected to external tensile forces and bending moments applied to the ends of one of its components. We develop a simple and physically meaningful predictive analytical (ldquomathematicalrdquo) model for the evaluation of the interfacial shearing and peeling stresses in the bonding material, with consideration of the effect of the compliance of the bonding layer. The developed model can be helpful in the stress-strain analysis and physical design of various assemblies of the type in question, and particularly of printed-circuit-board (PCB)/surface-mounted-device (SMD) assemblies in electronic and photonic packaging. Particularly, these models enable one to evaluate the maximum interfacial stresses in the bonding material from the predicted or measured strains in the PCB in the vicinity of the SMD package. The numerical example carried out for the case of PCB bending in a concave fashion indicated that the interfacial shearing stresses computed with consideration of the assembly bow were lower, and the peeling stresses calculated with taking into account the effect of tension, were higher, than the corresponding stresses predicted for the situation, when the assembly was subjected either to the tensile forces only, or to the bending moments only. We explain the physics of this phenomenon. We show, as an illustration, how the developed stress model can be used for the evaluation of the dynamic response of a PCB/SMD assembly to an impact loading applied to the PCB support contour.
  • Keywords
    bonding processes; electronics packaging; microassembling; reliability; soldering; stress-strain relations; surface mount technology; PCB; adhesively bonded assembly; bending moments; bimaterial assembly; electronic packaging; external tensile forces; interfacial shearing; interfacial stresses; peeling stresses; photonic packaging; printed-circuit-board; soldered assembly; stress-strain analysis; surface-mounted-device; Analytical models; Assembly; Bonding; Electronics packaging; Particle measurements; Predictive models; Shearing; Strain measurement; Stress measurement; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074088
  • Filename
    5074088