• DocumentCode
    2069186
  • Title

    Stress relaxation behaviour of connectors- development of simulation techniques

  • Author

    Schedin, E. ; Thuvander, A. ; Henderson, P. ; Sandberg, P. ; Kamf, A.

  • Author_Institution
    Swedish Inst. for Metals Res., Stockholm, Sweden
  • fYear
    1996
  • fDate
    16-20 Sept. 1996
  • Firstpage
    142
  • Lastpage
    150
  • Abstract
    The stress relaxation behaviour of a connector has been simulated using the Finite Element Method. Material data from stress relaxation tests (four-point-bending) are utilized as input data to derive the relaxation behaviour of a connector subjected to a steady state temperature field. The model comprises forming of the connector to a specified geometry and loading to a specified contact force. Relaxation data from four-point-bending tests are fitted to a power law expression for creep by setting a linear stress distribution through the sheet thickness. Other, more complex stress distributions were also used, but the result did not deviate much from the simple case. The creep data are used as input data for connector relaxation simulations. If relaxation data for the as-received material are utilized the rate of relaxation of the connector is underestimated compared to experiments. It is suggested that it is necessary to perform relaxation tests on cold worked material in order to correctly describe the relaxation behaviour of the bent portions of the connector. The effect of this approach is demonstrated and found successful. However, it is necessary to develop more reliable experimental methods to produce relaxation data on cold worked material.
  • Keywords
    electric connectors; finite element analysis; stress analysis; stress relaxation; cold worked material; connector; creep; finite element method; four-point-bending; power law; simulation; stress distribution; stress relaxation; temperature field; Connectors; Contacts; Creep; Finite element methods; Geometry; Materials testing; Solid modeling; Steady-state; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-3578-3
  • Type

    conf

  • DOI
    10.1109/HOLM.1996.557191
  • Filename
    557191