Title :
Validation of Nonlinear Bipolar Transistor Model by Small-Signal Measurements
Author :
Vidkjaer, J. ; Porra, V. ; Zhu, J. ; Huttunen, T.
Author_Institution :
Electromagnetics Inst., Technical Univ. of Denmark, DK-2800 Lyngby, Denmark
Abstract :
A new method for the validity analysis of nonlinear transistor models is presented based on DC-and small-signal S-parameter measurements and realistic consideration of the measurement and de-embedding errors and singularities of the small-signal equivalent circuit. As an example, some analysis results for an extended Gummel Poon model are presented in the case of a UHF bipolar power transistor.
Keywords :
Bipolar transistors; Covariance matrix; Ellipsoids; Matrix decomposition; Measurement errors; Power system modeling; Predictive models; Scattering parameters; Singular value decomposition; UHF measurements;
Conference_Titel :
Microwave Conference, 1992. 22nd European
Conference_Location :
Helsinki, Finland
DOI :
10.1109/EUMA.1992.335870
