• DocumentCode
    2069220
  • Title

    A 4-mW8-b 600-MS/s 2-b-per-cycle SAR ADC with a capacitive DAC

  • Author

    Jian Mei ; Jixuan Xiang ; Huabin Chen ; Ye Fan ; Junyan Ren

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • fYear
    2013
  • fDate
    28-31 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A 4-mW 8-b 600-MS/s 2-b-per-cycle (2 b/C) successive approximation register (SAR) analog-to-digital converter (ADC) is simulated in a standard 65-nm CMOS. By adopting reference capacitive DAC, four-input comparator and the data calibration unit, the proposed ADC could achieve higher speed. As simulated at sampling rate of 600 MS/s, the proposed ADC could achieve a peak SNR of 52.7 dB and maintain ENOB higher than 7.5 bits up to 302-MHz input signal frequency. The FoM of proposed ADC is 34.5 fJ/conversion-step at a 600-MS/s sampling rate and a 1.2-V supply.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; digital-analogue conversion; FoM; SAR ADC; data calibration unit; four-input comparator; power 4 mW; reference capacitive DAC; size 65 nm; standard CMOS process; successive approximation register analog-to-digital converter; voltage 1.2 V; word length 8 bit; Arrays; Calibration; Capacitors; Clocks; Logic arrays; Simulation; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2013 IEEE 10th International Conference on
  • Conference_Location
    Shenzhen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-4673-6415-7
  • Type

    conf

  • DOI
    10.1109/ASICON.2013.6812048
  • Filename
    6812048