• DocumentCode
    2069413
  • Title

    An integrative approach to reliability analysis of an IEC 61850 digital substation

  • Author

    Yan Zhang ; Sprintson, A. ; Singh, C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    2012
  • fDate
    22-26 July 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper focuses on the reliability evaluation of modern substation automation systems. Such systems include both physical devices such as lines, breakers, and transformers, as well as cyber devices (switches, intelligent electronic devices, and cables) and belong to a broader class of cyber-physical systems. We assume that the substation utilizes IEC 61850 standard, which is a dominant standard for substation automation. Focusing on IEC 61850 standard, we present the failure modes and analyze their effects on the system. We utilize reliability block diagrams for analyzing the reliability of substation components (bay units) and then use the state space approach to study the effects at the substation level. The results of our analysis provide critical input to evaluating the reliability of the substation and the effects of substation failures to the rest of the power system.
  • Keywords
    IEC standards; failure analysis; reliability; substation automation; IEC 61850 digital substation; cyber devices; cyber-physical systems; failure modes; integrative approach; intelligent electronic devices; modern substation automation systems; physical devices; power system; reliability analysis; reliability block diagrams; state space approach; substation component reliability; substation level; transformers; Circuit breakers; Circuit faults; IEC standards; Power system reliability; Power transmission lines; Reliability; Substations; Cyber-physical system; IEC 61850; State Space; reliability; substation layout; topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting, 2012 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1944-9925
  • Print_ISBN
    978-1-4673-2727-5
  • Electronic_ISBN
    1944-9925
  • Type

    conf

  • DOI
    10.1109/PESGM.2012.6345699
  • Filename
    6345699