• DocumentCode
    2070048
  • Title

    Frequent neighboring class set mining with constraint condition

  • Author

    Fang, Gang ; Xiong, Jiang ; Chen, Xiaofeng

  • Author_Institution
    Coll. of Math & Comput. Sci., Chongqing Three Gorges Univ., Chongqing, China
  • Volume
    1
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    242
  • Lastpage
    245
  • Abstract
    As these present frequent neighboring class set mining algorithms aren´t able to extract frequent neighboring class set with constraint condition, this paper proposes an algorithm of mining frequent neighboring class set with constraint condition based on down-up search strategy, which is suitable for mining frequent neighboring class set with constraint spatial classes in large spatial data. The algorithm uses the digital method to create database of neighboring class set, and then generates candidate frequent neighboring class set with constraint condition through down-up search strategy, namely, it connects two k-frequent neighboring class sets with constraint classes to generate (k+1)-candidate frequent neighboring class set with constraint classes, it only need scan once database to extract frequent neighboring class set with constraint condition. The algorithm uses logic operation to compute support of candidate frequent neighboring class set with constraint condition, it is very fast. The result of experiment indicates that the algorithm is fast and more efficient when mining short frequent neighboring class set with constraint condition in large spatial data.
  • Keywords
    data mining; database management systems; query formulation; constraint condition; digital method; down-up search strategy; frequent neighboring class set mining algorithm; logic operation; neighboring class set database; constraint condition; digital method; down-up search; frequent neighboring class set; spatial data mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6788-4
  • Type

    conf

  • DOI
    10.1109/PIC.2010.5687458
  • Filename
    5687458