DocumentCode :
2070463
Title :
Fault simulation basics
Author :
Seaton, J.
Author_Institution :
Zycad Corp., Menlo Park, CA
fYear :
1989
fDate :
25-28 Sep 1989
Lastpage :
39814
Abstract :
A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test
Keywords :
application specific integrated circuits; digital integrated circuits; digital simulation; electronic engineering computing; integrated circuit testing; ASIC; average defect levels; digital circuits; digital faults; economic benefits; empirical examples; fault collapsing algorithms; fault coverage; fault mechanisms; fault modeling techniques; fault simulation; manufacturing test; physical defects; tradeoffs of fault placement; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Electrical fault detection; Manufacturing; Power generation economics; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location :
Rochester, NY
Type :
conf
DOI :
10.1109/ASIC.1989.123161
Filename :
123161
Link To Document :
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