Title :
Pulse testing of network interface cards for upset and damage
Author :
Savage, Edward ; Radasky, William ; Smith, Kenneth ; Madrid, Michael
Author_Institution :
Metatech Corp., Goleta, CA
Abstract :
This paper reports on pulsed tests used to determine the susceptibility levels of various common NIC (network interface cards). It gives upset and damage levels for those cards and discusses various aspects of performing such tests.
Keywords :
computer equipment testing; electromagnetic interference; electromagnetic pulse; network interfaces; NIC; damage levels; network interface cards; pulse testing; Electromagnetic compatibility; Network interfaces; Testing;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559868
