Title :
Effect of stand-off height on microstructure and tensile strength of Cu/Sn-8Zn-3Bi/Cu and Cu/Sn-9Zn/Cu solder joints
Author :
Bin Du ; Wu, Fengshun ; Bo Wang ; Hui Liu ; Bing An ; Yiping Wu
Author_Institution :
State Key Lab. of Mater. Process. & Die & Mould Technol., Huazhong Univ. of Sci. & Technol., Wuhan
Abstract :
In this paper, the effect of the stand-off height (SOH) on the microstructure and tensile strength of Cu/Sn-8Zn-3Bi/Cu and Cu/Sn-9Zn/Cu solder joints with SOH of 100 mum, 50 mum, 20 mum and 10 mum were studied. The results show that as the SOH is reduced, the needle-like Zn-rich phase steadily decrease until completely disappeared in both of the two solder joints. For Cu/Sn-9Zn/Cu, Cu5Zn8 IMC is formed, while, for Cu/Sn-8Zn-3Bi/Cu, two IMC layers are formed, the first layer adjacent to the Cu substrate is a flat Cu5Zn8 phase, and the second layer adjacent to the solder bulk is a mixture of Cu-Sn + Cu-Zn. In Cu/Sn-9Zn/Cu solder joints, the dissociative Cu5Zn8 intermetallic compound (IMC) increases with the reduced SOH, while there are less dissociative IMCs found in the Cu/Sn-8Zn-3Bi/Cu solder joints. Bi dissolves into the solder bulk and does not participate in the interfacial reaction. Due to the addition of Bi, the tensile strength of the Cu/Sn-8Zn-3Bi/Cu solder joint is higher than that of the Cu/Sn9Zn/Cu solder joint. From the results of the tensile test, it is found that the ultimate tensile strength (UTS) of Cu/Sn-9Zn/Cu solder joints is decreased with the reduced SOH, while for Cu/Sn-8Zn-3Bi/Cu solder joints the UTS is increased.
Keywords :
alloying additions; bismuth alloys; copper alloys; crystal microstructure; dissolving; reliability; solders; tensile strength; tensile testing; tin alloys; zinc alloys; Cu-Sn-Zn-Bi-Cu; Cu-Sn-Zn-Cu; IMC; UTS; intermetallic compound; microstructure; needle-like Zn-rich phase; size 10 mum to 100 mum; solder joints; stand-off height; tensile strength; tensile test; ultimate tensile strength; Bars; Bismuth; Land surface temperature; Mechanical factors; Microelectronics; Microstructure; Packaging; Soldering; Testing; Wafer scale integration; Sn-8Zn-3Bi; Sn-9Zn; Stand-off height (SOH); Tensile test;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074140