Title :
Design and Experiments of Photon Counting Imaging Test Platform
Author :
Yin, Liju ; Chen, Qian
Author_Institution :
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
Abstract :
The photon counting avalanche photodiode (APD) imaging test platform is put up according to the semi-classical theory of photoelectric detection which the classical statistical fluctuation of the light field is combined with the fluctuation of the interaction between light and matter. A mathematical model between APD photon counting frequency´s expectation and input gray levels is set up. With changes of scene gray, the photon number of reflective radiation is bigger; photon counting frequency expectation of the corresponding sampling points will be greater. A black white stripe image is scanned at 10-3lx low light level (LLL) illumination. In accordance with the established mathematical model and the scanning mechanism, the photon counting output appearing as one-dimensional time-domain will be represented as two-dimensional image information.
Keywords :
avalanche photodiodes; image restoration; photodetectors; photon counting; avalanche photodiode; classical statistical fluctuation; image restoration; light field fluctuation; mathematical model; photoelectric detection; photon counting imaging test platform; reflective radiation; scanning mechanism; scene gray; semi-classical theory; Avalanche photodiodes; Charge carrier processes; Electronic equipment testing; Fluctuations; Laser radar; Optical imaging; Optical sensors; Optoelectronic and photonic sensors; Signal detection; Signal processing;
Conference_Titel :
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4129-7
Electronic_ISBN :
978-1-4244-4131-0
DOI :
10.1109/CISP.2009.5300964