Title :
Proceedings Eighth IEEE European Test Workshop
Abstract :
The following topics are dealt with: DFT; BIST; memory test; asynchronous test; SoC testing; defect-oriented test; ATPG; functional validation; scan and core testing; RF, EME, and probing; delay testing; and exploiting 1149.1 for debug and core test.
Keywords :
automatic test pattern generation; automatic testing; built-in self test; design for testability; integrated circuit testing; integrated memory circuits; logic testing; system-on-chip; ATPG; BIST; DFT; EME; European test workshop; RF testing; SoC testing; asynchronous test; core testing; debug; defect-oriented test; delay testing; functional validation; memory test; probing; scan testing; Automatic testing; Design for testability; Integrated circuit testing; Logic circuit testing; Self-testing; Semiconductor memories;
Conference_Titel :
Test Workshop, 2003. Proceedings. The Eighth IEEE European
Conference_Location :
Maastricht, Netherlands
Print_ISBN :
0-7695-1908-3
DOI :
10.1109/ETW.2003.1231660
