DocumentCode
2071085
Title
Numerical evaluation of the influence of technology incorrectness on CoolMOS features
Author
Lisik, Zbigniew ; Podgorski, Jacek ; Raj, Ewa
Author_Institution
Inst. of Electron., Lodz Tech. Univ., Poland
fYear
2004
fDate
28-28 Feb. 2004
Firstpage
565
Lastpage
567
Abstract
The modern unipolar power structures - CoolMOS were to become a breakthrough among the power devices. However, until now no one could manufacture the structures, which parameters overcome the parameters of traditional VDMOS transistors in a significant way. The cause of it is placed in the fact, probably that the manufacturing technology for them is very complicated and advanced. The authors have introduced the analyses of dependencies of the CoolMOS transistor static parameters versus its constructional ones.
Keywords
numerical analysis; power MOSFET; CoolMOS transistor static parameters; VDMOS transistors; manufacturing technology; numerical evaluation; power devices; technology incorrectness; unipolar power structures; Doping; Fabrication; MOSFET circuits; Manufacturing; Power MOSFET; Power semiconductor devices; Power transistors; Semiconductor device manufacture; Technological innovation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2004. Proceedings of the International Conference
Conference_Location
Lviv-Slavsko, Ukraine
Print_ISBN
966-553-380-0
Type
conf
Filename
1366073
Link To Document