• DocumentCode
    2071085
  • Title

    Numerical evaluation of the influence of technology incorrectness on CoolMOS features

  • Author

    Lisik, Zbigniew ; Podgorski, Jacek ; Raj, Ewa

  • Author_Institution
    Inst. of Electron., Lodz Tech. Univ., Poland
  • fYear
    2004
  • fDate
    28-28 Feb. 2004
  • Firstpage
    565
  • Lastpage
    567
  • Abstract
    The modern unipolar power structures - CoolMOS were to become a breakthrough among the power devices. However, until now no one could manufacture the structures, which parameters overcome the parameters of traditional VDMOS transistors in a significant way. The cause of it is placed in the fact, probably that the manufacturing technology for them is very complicated and advanced. The authors have introduced the analyses of dependencies of the CoolMOS transistor static parameters versus its constructional ones.
  • Keywords
    numerical analysis; power MOSFET; CoolMOS transistor static parameters; VDMOS transistors; manufacturing technology; numerical evaluation; power devices; technology incorrectness; unipolar power structures; Doping; Fabrication; MOSFET circuits; Manufacturing; Power MOSFET; Power semiconductor devices; Power transistors; Semiconductor device manufacture; Technological innovation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2004. Proceedings of the International Conference
  • Conference_Location
    Lviv-Slavsko, Ukraine
  • Print_ISBN
    966-553-380-0
  • Type

    conf

  • Filename
    1366073