• DocumentCode
    2071086
  • Title

    Introduction of randomness in deterministic descriptions of Reverberation Chambers

  • Author

    Serra, Ramiro ; Canavero, Flavio

  • Author_Institution
    Dipt. di Elettron., Politec. di Torino, Turin
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    387
  • Lastpage
    390
  • Abstract
    The main purpose of this work is to present some simple yet complete models that are able to describe the statistical behavior of reverberation chambers (RC) as well as the influence of their main factors and their overall functioning. We start by building a simplified two-dimensional model which is able to reproduce the statistical behavior of real RCs without renouncing the advantages of deterministic descriptions. The statistical properties of the fields inside the cavity are introduced either by varying the width or the relative dielectric constant of a perturbing lossless layer inside a 2D cavity. The field statistics derived with this process are shown to correspond to the statistics found in properly functioning RCs in the overmoded regime. With the use of a suitable coordinate transformation, we assume our non-homogeneous rectangular cavity to be a virtual mathematical domain, and find an analogous homogeneous non-rectangular cavity as our physical domain. With this simple process we are able to link our 2D ldquodielectricrdquo stirrer with actual geometrical discontinuities. By means of this procedure, a novel design for RCs appears as feasible.
  • Keywords
    permittivity; random processes; reverberation chambers; 2D dielectric stirrer; perturbing lossless layer; randomness; relative dielectric constant; reverberation chambers; Dielectric constant; Dielectric losses; Electromagnetic fields; Filling; Gaussian distribution; Geometry; Reverberation chamber; Solid modeling; Statistics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559893
  • Filename
    4559893