Title :
Universal electric and magnetic field analyzer system
Author :
Ho, Yong Cheh ; Pommerenke, David ; Li, Tun
Author_Institution :
Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
Abstract :
Near-field probing is often used to determine the sources and coupling paths of an electromagnetic interference problem above a printed circuit board or integrated circuits chip. A wideband universal field analyzer was developed in order to measure circularly and linearly polarized magnetic fields and total electric field in a rapid sequence using a single probe design.
Keywords :
electromagnetic interference; integrated circuits; printed circuits; circularly polarized magnetic fields; electromagnetic interference; integrated circuits; linearly polarized magnetic fields; printed circuit board; wideband universal field analyzer; Coupling circuits; Electric variables measurement; Electromagnetic coupling; Electromagnetic interference; Magnetic analysis; Magnetic field measurement; Magnetic fields; Printed circuits; Semiconductor device measurement; Wideband;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559894
