Title :
Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation
Author :
Ding, W. ; Gorbach, A.V. ; Wadsworth, W.J. ; Knight, J.C. ; Skryabin, D.V. ; Strain, M.J. ; Sorel, M. ; De La Rue, R.M.
Author_Institution :
Dept. of Phys., Univ. of Bath, Bath, UK
Abstract :
Silicon photonics has attracted much attention. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation.
Keywords :
integrated optics; optical correlation; optical solitons; optical variables measurement; optical waveguides; silicon-on-insulator; SOI waveguides; Si; frequency-domain measurements; nonlinear processes; silicon photonics; soliton formation; subwavelength silicon waveguides; subwavelength silicon-on-insulator waveguides; time-domain measurements; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5943163
