Title :
Effect of power supply imbalance on NF of CMOS low noise amplifier for UHF RFID applications
Author :
Koo, Kyoungchoul ; Shim, Jongjoo ; Park, Hyunjeong ; Kim, Joungho
Author_Institution :
Sch. of EECS, KAIST, Daejeon
Abstract :
In this paper, noise figure (NF) degradation of CMOS low noise amplifier (LNA) for UHF RFID application, which is caused by power/ground noise (P/G noise) from power supply imbalance is analyzed. Then, a modified NF formula to estimate the effect of P/G noise from power supply imbalance is proposed. Because the power supply imbalance is caused by package (PKG) and on-chip power/ground distribution network (PDN) structure, PKG and on-chip PDN are modeled. Also, the equivalent circuit of LNA is modeled to simulate the proposed NF formula. The proposed NF formula is verified with measurement of single-tone and clock P/G noise. It shows 50 m, 800 MHz single-tone P/G noise at PKG PWR/GND port degrades about 120 dB of NF at 800 MHz.
Keywords :
CMOS analogue integrated circuits; equivalent circuits; low noise amplifiers; radiofrequency identification; CMOS low noise amplifier; UHF RFID; noise figure; power supply imbalance; power/ground distribution network structure; power/ground noise; Circuit noise; Degradation; Equivalent circuits; Low-noise amplifiers; Network-on-a-chip; Noise figure; Noise measurement; Packaging; Power supplies; Radiofrequency identification;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559904