Automating test program generation in STIL - expectations and experiences using IEEE 1450 [standard test interface language]

At the International Test Conference 2002 several low cost test solutions were presented. All of these solutions promised to establish a close link between automatic test pattern generation, ATE based testing and fault diagnosis/analysis by using the IEEE 1450 standard test interface language (STIL). However, the reality is different. This paper describes the integration of a STIL based tester into the standard Motorola test program generation flow. The expected benefits of this very low cost test approach are measured against the problems which had to be solved in order to achieve a high degree of automation. All remaining problems described in this paper need to be addressed by the EDA vendors, the ATE companies and the different STIL committees. Only when these issues are resolved will STIL become a success for the test world.