Title :
Effect of damping and air cushion on dynamic responses of PCB under product level free drop impact
Author :
Park, Seungbae ; Yu, Da ; Al-Yafawi, Abdullah ; Kwak, Jae ; Lee, John
Author_Institution :
Dept. of Mech. Eng., State Univ. of New York at Binghamton, Binghamton, NY
Abstract :
The dynamic response of printed circuit board (PCB) is a major concern to electronic manufacturers when it is subjected to drop impact. In this work, more realistic drop condition is achieved through product-level free drop test. A repeatable free-drop system is developed with an adjustable pair of forks to control the impact orientation during the guided free drop. Digital image correlation (DIC) technique is applied to measure and produce the full-field dynamic responses of PCB. Air cushion effect between mobile phone and impact surface is found experimentally, which may be considered significant for the product-level free drop test. The rebound test has been performed to measure the actual impact velocity and to provide a better insight into the drop impact event. The effect of impact velocity is investigated to assess dynamic responses of PCB. Along with the drop impact experiments, the 3D FEA models are analyzed using ANSYS/LS-DYNA. The energy loss from the damping is considered by including the Rayleigh damping in this FEA model. Vibration analysis is performed experimentally and numerically to choose the proper damping parameters.
Keywords :
damping; finite element analysis; mobile handsets; printed circuits; software packages; 3D FEA models; ANSYS/LS-DYNA; Rayleigh damping; air cushion; digital image correlation; dynamic responses; mobile phone; printed circuit board; product level free drop impact; vibration analysis; Circuit testing; Control systems; Damping; Digital images; Energy loss; Manufacturing; Mobile handsets; Performance evaluation; Printed circuits; Velocity measurement; PCB; Rayleigh damping; air cushion effect; finite element method; product level free drop impact;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074172