DocumentCode
2071520
Title
Comparison of switching behavior of miniaturization relay with single and twin contacts
Author
Wang, Min-Gou ; Sawa, Koichiro
Author_Institution
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
fYear
1996
fDate
16-20 Sept. 1996
Firstpage
269
Lastpage
275
Abstract
It is expected that relays and switches with twin contacts can obtain a higher reliability and longer life. In order to verify this consideration, the experiments were performed with the relays, which have single and twin contacts respectively. The results demonstrated that main failure is sticking for the contacts tested under less than dc 500 mA/5 V. Because of the difference in structure, the twin contacts is easier to stick than the single. On the other hand, the resistance of the twin contact is low and stable than that of the single, and the average contact resistance becomes smaller along with increasing in load current.
Keywords
contact resistance; relays; 5 V; 500 mA; contact resistance; failure; life; miniaturization relay; reliability; single contact; sticking; switching; twin contact; Automatic testing; Contact resistance; Electrical resistance measurement; Frequency; Materials testing; Relays; Springs; Telecommunication computing; Telecommunication control; Telecommunication switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-3578-3
Type
conf
DOI
10.1109/HOLM.1996.557206
Filename
557206
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