• DocumentCode
    2071520
  • Title

    Comparison of switching behavior of miniaturization relay with single and twin contacts

  • Author

    Wang, Min-Gou ; Sawa, Koichiro

  • Author_Institution
    Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    1996
  • fDate
    16-20 Sept. 1996
  • Firstpage
    269
  • Lastpage
    275
  • Abstract
    It is expected that relays and switches with twin contacts can obtain a higher reliability and longer life. In order to verify this consideration, the experiments were performed with the relays, which have single and twin contacts respectively. The results demonstrated that main failure is sticking for the contacts tested under less than dc 500 mA/5 V. Because of the difference in structure, the twin contacts is easier to stick than the single. On the other hand, the resistance of the twin contact is low and stable than that of the single, and the average contact resistance becomes smaller along with increasing in load current.
  • Keywords
    contact resistance; relays; 5 V; 500 mA; contact resistance; failure; life; miniaturization relay; reliability; single contact; sticking; switching; twin contact; Automatic testing; Contact resistance; Electrical resistance measurement; Frequency; Materials testing; Relays; Springs; Telecommunication computing; Telecommunication control; Telecommunication switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-3578-3
  • Type

    conf

  • DOI
    10.1109/HOLM.1996.557206
  • Filename
    557206