DocumentCode
2071800
Title
ASTA-an integrated system for BIST analysis & automatic test generation
Author
Hodgson, S. ; Theobald, L. ; Hughes, W.B. ; Illman, R.J.
fYear
1990
fDate
12-15 Mar 1990
Firstpage
7
Lastpage
12
Abstract
The automatic self test analysis (ASTA) tools are an integrated part of the ICL DA-X system. ASTA analyses a design for self-testability, automatically generates chip test data, calculates signatures and outputs tester format data. Tests for primitive logic will be exhaustive or quasi-exhaustive, but for larger cells, specific test methods can be defined using an ASTA language. The system, which is Esprit-funded, has been used successfully for two complex ASIC chips
Keywords
application specific integrated circuits; automatic testing; built-in self test; electronic engineering computing; integrated circuit testing; ASIC chips; ASTA language; ASTA tools; BIST analysis; ICL DA-X system; automatic self test analysis; automatic test generation; integrated system; primitive logic; signatures; tester format data; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Libraries; Logic testing; Production systems; Registers; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location
Glasgow
Print_ISBN
0-8186-2024-2
Type
conf
DOI
10.1109/EDAC.1990.136611
Filename
136611
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