Title :
Development of test programs with the aid of a tester oriented pattern language
Author :
Klimke, Martin ; Winkelmeyr, Christian ; Eichinger, Herbert
Author_Institution :
Siemens AG, Munich, Germany
Abstract :
Presents a methodology by which, irrespective of the tester used, test programs for testing integrated circuits can be created with the aid of a high-level language
Keywords :
electronic engineering computing; integrated circuit testing; specification languages; high-level language; integrated circuits; test programs; tester oriented pattern language; Automatic testing; Circuit testing; Electronics packaging; High level languages; Integrated circuit testing; Logic devices; Logic testing; Semiconductor device testing; System testing; Timing;
Conference_Titel :
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location :
Glasgow
Print_ISBN :
0-8186-2024-2
DOI :
10.1109/EDAC.1990.136613
