DocumentCode :
2072104
Title :
Line Detection in Image Based on Edge Enhancement
Author :
Chen, Bin ; Zhong, Hua
Author_Institution :
Xi´´an Univ. of Technol., Xi´´an, China
fYear :
2009
fDate :
26-28 Dec. 2009
Firstpage :
415
Lastpage :
418
Abstract :
The Radon transform is an important tool to detect line features in the image and it has strong anti-noise ability. The traditional method, which the first step is to do edge detection and then to do the Radon transform, exists some defects. Therefore, this paper has made some improvements, that is, using the empirical mode decomposition (EMD) method to decompose the image under different scales. The intrinsic mode functions (IMFS) are obtained. The first IMF, on finest scale, is superposed with the gradient of the image, so as to enhance the edge of the image. This method can avoid the interference information that directly doing edge detection brings. In addition, the global Radon transform can not detect the length of the segment as well as the endpoint information, and also has difficulty in detecting the short segments. For these defects, the idea of Local Radon transform has been adopted in this paper. The main method is to move a sliding window on the image, then do Radon transform on the region that covered by the sliding window. The experiment results show that our method is efficient to detect the line features in image.
Keywords :
Radon transforms; edge detection; feature extraction; image enhancement; Local Radon transform; edge detection; empirical mode decomposition method; image enhancement; intrinsic mode functions; line feature detection; sliding window; Image edge detection; Information science; EMD; Local Radon transform; edge enhancement; line features;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science and Engineering (ISISE), 2009 Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6325-1
Electronic_ISBN :
978-1-4244-6326-8
Type :
conf
DOI :
10.1109/ISISE.2009.100
Filename :
5447258
Link To Document :
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