• DocumentCode
    2072391
  • Title

    A novel ultra-thin package for embedded high-pin-count LSI supported by Cu plate

  • Author

    Mori, Kentaro ; Ohshima, Daisuke ; Sasaki, Hideki ; Fujimura, Yuki ; Kikuchi, Katsumi ; Nakashima, Yoshiki ; Funaya, Takuo ; Nishiyama, Tomohiro ; Murakami, Tomoo ; Yamamichi, Shintaro

  • Author_Institution
    Device Platforms Res. Labs., NEC Corp., Sagamihara
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1447
  • Lastpage
    1452
  • Abstract
    We have developed a thin, low-thermal-resistance LSI package by embedding a high-pin-count LSI chip into ultra-thin build-up layers supported by Cu plate. The embedded LSI chip is a microprocessor with approximately 1500 pads and a thickness of 50 mum, and it is completely laminated by the first build-up epoxy resin. The total package thickness is only 0.71 mm including a 0.5-mm-thick Cu plate for cooling, which is much thinner than the conventional flip chip ball grid array (FCBGA) package with a heat sink. Our package shows excellent warpage characteristics, smaller than 82 mum in the temperature range from -55 to +260degC. Low thermal resistance of 10.8degC/W is achieved at a wind velocity of 0 m/s, which is also comparable to that of the FCBGA with a large heat sink. We have successfully demonstrated the functions of this package using an LSI tester and personal-computer-like system board. It has also passed a 600-cycle package-level thermal cycle test.
  • Keywords
    cooling; copper; integrated circuit packaging; integrated circuit testing; large scale integration; microprocessor chips; thermal analysis; Cu; cooling; embedded high-pin-count LSI; epoxy resin; heat sink; microprocessor; package-level thermal cycle test; personal-computer-like system board; thermal resistance; ultra-thin package; warpage characteristics; Cooling; Electronics packaging; Epoxy resins; Flip chip; Heat sinks; Large scale integration; Microprocessors; Temperature distribution; Thermal resistance; Wind speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074202
  • Filename
    5074202