DocumentCode :
2072441
Title :
Study on measurement uncertainty in immunity testing: IEC61000-4-6
Author :
Kurosawa, Taiju ; Sakusabe, Takashi ; Takahashi, Takehiro ; Schibuya, Noboru
Author_Institution :
Grad. Sch. of Electron. & Inf. Eng., Takushoku Univ., Tokyo
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
598
Lastpage :
601
Abstract :
Factors of the measurement uncertainty (MU) are analyzed and calculated, to examine a dominant MU factor in the IEC/EMC immunity standard such as IEC61000-4-3,-6 etc., in accordance with ISO guide 17025 describing uncertainty in measurement. It was assumed that the contribution factors to MU are the measurement system repeatability, accuracy of the signal generator, amplifier gain and harmonics, accuracy of the oscilloscope, mismatch, modulation, and test-setup. From the experimental result, it was obtained that the most important uncertainty factor was ldquotest setuprdquo. This means that ldquosetuprdquo influences the test-level. Therefore, we suggest that if application of the uncertainty is effectively done, it is necessary to define the setup clearly.
Keywords :
IEC standards; calibration; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; immunity testing; measurement uncertainty; amplifier gain; amplifier harmonics; calibration; electromagnetic compatibility; immunity standard IEC61000-4-6; immunity testing; measurement system repeatability; measurement uncertainty; mismatch uncertainty; modulation uncertainty; oscilloscope accuracy; signal generator accuracy; test setup uncertainty; uncertainty factor; Electromagnetic compatibility; Gain measurement; IEC standards; ISO standards; Immunity testing; Measurement standards; Measurement uncertainty; Oscilloscopes; Signal generators; System testing; immunity testing; measurement uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4559946
Filename :
4559946
Link To Document :
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