• DocumentCode
    2072503
  • Title

    Electrothermal SPICE macromodeling of the power bipolar transistor including the avalanche and secondary breakdowns

  • Author

    Maxim, Adrian ; Maxim, Gheorghe

  • Author_Institution
    Dept. of Electron., Asachi Tech. Univ., Iasi, Romania
  • Volume
    1
  • fYear
    1998
  • fDate
    31 Aug-4 Sep 1998
  • Firstpage
    348
  • Abstract
    The analog behavioral SPICE macromodeling method has been used to develop a new BJT electrothermal macromodel, that includes the avalanche and secondary breakdowns. The electrical laws are modeled by means of “in-line equation” controlled sources, and the thermal laws are described with a dummy RC network. The great overcome of this behavioral macromodel is the portability to a large number of general purpose electronic circuits simulators. The starting point for the electrical model are the Gummel-Poon equations, that were adapted for power bipolar structures. Thus the electrothermal macromodel keeps the compatibility with existing purely electric models. Several methods to enhance the analysis convergence have been proposed and the simulation results show a good agreement with data sheets characteristics
  • Keywords
    SPICE; avalanche breakdown; circuit analysis computing; power bipolar transistors; semiconductor device models; BJT; Gummel-Poon equations; analog behavioral SPICE macromodel; avalanche breakdown; dummy RC network; electronic circuits simulators; electrothermal SPICE macromodeling; in-line equation controlled sources; power bipolar transistor; secondary breakdown; thermal laws; Analytical models; Avalanche breakdown; Bipolar transistors; Circuit simulation; Convergence; Electronic circuits; Electrothermal effects; Equations; Radio control; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
  • Conference_Location
    Aachen
  • Print_ISBN
    0-7803-4503-7
  • Type

    conf

  • DOI
    10.1109/IECON.1998.724148
  • Filename
    724148