DocumentCode
2072614
Title
Process improvement for traceability: A study of human fallibility
Author
Kong, Wei-Keat ; Hayes, Jane Huffman ; Dekhtyar, Alex ; Dekhtyar, Olga
Author_Institution
Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
fYear
2012
fDate
24-28 Sept. 2012
Firstpage
31
Lastpage
40
Abstract
Human analysts working with results from automated traceability tools often make incorrect decisions that lead to lower quality final trace matrices. As the human must vet the results of trace tools for mission- and safety-critical systems, the hopes of developing expedient and accurate tracing procedures lies in understanding how analysts work with trace matrices. This paper describes a study to understand when and why humans make correct and incorrect decisions during tracing tasks through logs of analyst actions. In addition to the traditional measures of recall and precision to describe the accuracy of the results, we introduce and study new measures that focus on analyst work quality: potential recall, sensitivity, and effort distribution. We use these measures to visualize analyst progress towards the final trace matrix, identifying factors that may influence their performance and determining how actual tracing strategies, derived from analyst logs, affect results.
Keywords
data visualisation; formal verification; human factors; program diagnostics; safety-critical software; software metrics; software process improvement; software tools; analyst action logs; analyst progress visualization; automated traceability tools; effort distribution; human fallibility; mission-critical systems; potential recall; process improvement; safety-critical systems; sensitivity; trace matrices; tracing procedures; tracing tasks; Accuracy; Atmospheric measurements; Educational institutions; Humans; Particle measurements; Sensitivity; Software engineering; Human Factors; Performance Measures; Process Improvement; Traceability; Tracing Strategies;
fLanguage
English
Publisher
ieee
Conference_Titel
Requirements Engineering Conference (RE), 2012 20th IEEE International
Conference_Location
Chicago, IL
ISSN
1090-750X
Print_ISBN
978-1-4673-2783-1
Electronic_ISBN
1090-750X
Type
conf
DOI
10.1109/RE.2012.6345824
Filename
6345824
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