Measurements of the bi-linear elasticity of identical carbon nanotubes

Author

Nakajima, Masahiro ; Arai, Fumihito ; Dong, Lixin ; Fukuda, Toshio

Author_Institution

Dept. of Micro Syst. Eng., Nagoya Univ., Japan

Volume

1

fYear

2003

fDate

12-14 Aug. 2003

Firstpage

156

Abstract

Measurements of the bi-linear elasticity of identical carbon nanotubes (CNTs) by both buckling process and electromechanical resonance are presented. When the bending moment is applied to a CNT, the elastic modulus of a CNT changes with its curvature on the bi-linear reaction, caused by the appearance of ripping mode, which is the wave like distortion or ripples on the inner arc of a bent CNT. In this paper we measure the elastic moduli of identical CNTs respectively by both buckling process using an atomic force microscope (AFM) cantilever E_b and electromechanical resonance E_e through nanorobotic manipulators inside a field emission scanning electron microscope (FE-SEM). Average of three samples shows that E_e (∼43 GPa) is much smaller than E_b (∼1.87 TPa). This is the first measurements of the bi-linear elasticity of the identical CNTs.

Keywords

atomic force microscopy; bending; buckling; carbon nanotubes; elastic moduli; electromechanical effects; scanning electron microscopy; AFM; C; SEM; atomic force microscopy; bending moment; bilinear elasticity; bilinear reaction; buckling process; cantilever; carbon nanotubes; elastic modulus; electromechanical resonance; field emission scanning electron microscopy; nanorobotic manipulators; ripping mode; Atomic force microscopy; Atomic measurements; Carbon nanotubes; Elasticity; Force measurement; Mechanical factors; Probes; Resonance; Scanning electron microscopy; Tungsten;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on

Print_ISBN

0-7803-7976-4

Type

conf

DOI

10.1109/NANO.2003.1231739

Filename

1231739