DocumentCode :
2072901
Title :
Measurements of the bi-linear elasticity of identical carbon nanotubes
Author :
Nakajima, Masahiro ; Arai, Fumihito ; Dong, Lixin ; Fukuda, Toshio
Author_Institution :
Dept. of Micro Syst. Eng., Nagoya Univ., Japan
Volume :
1
fYear :
2003
fDate :
12-14 Aug. 2003
Firstpage :
156
Abstract :
Measurements of the bi-linear elasticity of identical carbon nanotubes (CNTs) by both buckling process and electromechanical resonance are presented. When the bending moment is applied to a CNT, the elastic modulus of a CNT changes with its curvature on the bi-linear reaction, caused by the appearance of ripping mode, which is the wave like distortion or ripples on the inner arc of a bent CNT. In this paper we measure the elastic moduli of identical CNTs respectively by both buckling process using an atomic force microscope (AFM) cantilever Eb and electromechanical resonance Ee through nanorobotic manipulators inside a field emission scanning electron microscope (FE-SEM). Average of three samples shows that Ee (∼43 GPa) is much smaller than Eb (∼1.87 TPa). This is the first measurements of the bi-linear elasticity of the identical CNTs.
Keywords :
atomic force microscopy; bending; buckling; carbon nanotubes; elastic moduli; electromechanical effects; scanning electron microscopy; AFM; C; SEM; atomic force microscopy; bending moment; bilinear elasticity; bilinear reaction; buckling process; cantilever; carbon nanotubes; elastic modulus; electromechanical resonance; field emission scanning electron microscopy; nanorobotic manipulators; ripping mode; Atomic force microscopy; Atomic measurements; Carbon nanotubes; Elasticity; Force measurement; Mechanical factors; Probes; Resonance; Scanning electron microscopy; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
Type :
conf
DOI :
10.1109/NANO.2003.1231739
Filename :
1231739
Link To Document :
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