Perspective on BiCMOS

Author

Wong, Thomas

Author_Institution

Hitachi America Ltd., Brisbane, CA, USA

fYear

1989

fDate

25-28 Sep 1989

Lastpage

38018

Abstract

The objective of Hi-BiCMOS is to combine speed performance approaching that of ECL and integration density approaching that of CMOS. A high-performance 1.3-μm BiCMOS technology and its applications to ASICs (application-specific integrated circuits) are described. This Hi-BiCMOS gate array contains 3072 gates and 90 input/output buffers. The inclusion of bipolar transistors enables this array to support both TTL (transistor-transistor logic) and ECL logic interfaces. A Hi-BiCMOS memory-plus-logic gate array has also been fabricated using a 1.3-μm drawn two-layer metal silicon gate process technology. It contains approximately 10 K logic gates, 4.6 kb of triple port RAM, and 220 input/output buffers. A Hi-BiCMOS standard cell library has been developed to improve design productivity in microprocessor designs. Megacells such as ALUs, registers, ROMs, RAMs, multipliers and other macrofunctions are available as part of the macro library

Keywords

BIMOS integrated circuits; VLSI; application specific integrated circuits; integrated memory circuits; logic arrays; microprocessor chips; 1.3 micron; 4.6 kbit; ASICs; BiCMOS; ECL I/Os; ECL compatibility; ECL logic interfaces; Hi-BiCMOS; Hi-BiCMOS gate array; Si gate technology; TTL I/Os; TTL compatibility; TTL logic interfaces; VLSI; application-specific integrated circuits; bipolar transistors; integration density; macro library; macrocells; macrofunctions; megacells; memory-plus-logic gate array; microprocessor designs; output buffers; silicon gate process technology; speed performance; standard cell library; transistor-transistor logic; triple port RAM; two-layer metal; Application specific integrated circuits; BiCMOS integrated circuits; Bipolar transistors; CMOS logic circuits; CMOS technology; Integrated circuit technology; Libraries; Logic arrays; Logic gates; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE

Conference_Location

Rochester, NY

Type

conf

DOI

10.1109/ASIC.1989.123174

Filename

123174